• DocumentCode
    136783
  • Title

    A stator current locus approach to induction machine parameter estimation

  • Author

    Reed, David M. ; Kan Zhou ; Hofmann, Heath F. ; Jing Sun

  • Author_Institution
    Dept. of Electr. Eng. & Comput. Sci., Univ. of Michigan, Ann Arbor, MI, USA
  • fYear
    2014
  • fDate
    Aug. 31 2014-Sept. 3 2014
  • Firstpage
    1
  • Lastpage
    6
  • Abstract
    Induction machines are an attractive alternative to permanent magnet machines in transportation applications due to their ruggedness and lower cost of construction. However, high-performance control of induction machines requires accurate knowledge of the machine parameters. While parameters have traditionally been identified using the standard “no-load” and “locked-rotor” tests, these tests are not representative of normal operating conditions, and are not well suited to the commissioning of variable speed drives. This paper presents a new method for induction machine parameter identification using steady-state measurements, which is based on fitting data to the stator current locus for various slip frequencies. Numerical results confirm the method´s high accuracy, while experimental results demonstrate its ability to characterize an induction machine over a range of flux levels which include magnetic saturation.
  • Keywords
    asynchronous machines; machine control; parameter estimation; permanent magnet machines; transportation; variable speed drives; high performance control; induction machine parameter estimation; induction machine parameter identification; locked-rotor tests; machine parameters; magnetic saturation; no-load tests; permanent magnet machines; slip frequencies; stator current locus approach; steady-state measurements; transportation; variable speed drives; Couplings; Induction machines; Resistance; Rotors; Stators; Steady-state; Voltage measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Transportation Electrification Asia-Pacific (ITEC Asia-Pacific), 2014 IEEE Conference and Expo
  • Conference_Location
    Beijing
  • Print_ISBN
    978-1-4799-4240-4
  • Type

    conf

  • DOI
    10.1109/ITEC-AP.2014.6941055
  • Filename
    6941055