• DocumentCode
    1367942
  • Title

    The fault dropping problem in concurrent event-driven simulation

  • Author

    Gai, Silvano ; Montessoro, Pier Luca

  • Author_Institution
    Politecnico di Torino, Italy
  • Volume
    10
  • Issue
    8
  • fYear
    1991
  • fDate
    8/1/1991 12:00:00 AM
  • Firstpage
    968
  • Lastpage
    971
  • Abstract
    The dynamic removal of faults before the end of the test pattern is reached, called fault dropping (FD), is considered. The conventional technique, called synchronous FD, is analyzed. An asynchronous FD method is introduced and its performance compared with that of the conventional method. It is based on the concept of removing descriptors while the simulation procedures access the data structure. This technique guarantees the maximum efficiency in reducing the computational effort. Experimental results show that it can considerably speed up simulation, particularly for large networks. It is shown that a mixed synchronous/asynchronous approach can optimize the total amount of memory needed
  • Keywords
    circuit analysis computing; digital simulation; fault location; asynchronous FD method; concurrent event-driven simulation; data structure accessing; dynamic fault removal; fault dropping; large networks; mixed synchronous/asynchronous approach; synchronous FD; test pattern; Benchmark testing; Central Processing Unit; Circuit faults; Circuit simulation; Circuit testing; Computational modeling; Data structures; Discrete event simulation; Electrical fault detection; Fault detection;
  • fLanguage
    English
  • Journal_Title
    Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0278-0070
  • Type

    jour

  • DOI
    10.1109/43.85734
  • Filename
    85734