• DocumentCode
    1368151
  • Title

    Evaluation of an STM-SQUID Probe Microscope

  • Author

    Watanabe, Norimichi ; Hayashi, Tadayuki ; Tachiki, Minoru ; He, Dongfeng ; Itozaki, Hideo

  • Author_Institution
    Osaka Univ., Toyonaka, Japan
  • Volume
    21
  • Issue
    3
  • fYear
    2011
  • fDate
    6/1/2011 12:00:00 AM
  • Firstpage
    420
  • Lastpage
    423
  • Abstract
    We have developed a STM-SQUID probe microscope that combines a SQUID probe microscope and a scanning tunneling microscope (STM). We improved the spatial resolution of the SQUID probe microscope by transmitting the magnetic field to the SQUID by use of a high permeability permalloy probe. It can measure topography of the sample surface and the magnetic field of the sample at the same time using the permalloy probe as a STM probe. In the present study, we have measured the magnetic field distribution generated by a meander line whose line plus spacing were 10 μm. The meander line is useful for estimating the performance of the STM-SQUID probe microscope because we can quantify the magnetic field of a meander line to which a current is applied. We also measured the magnetic field on the sample surface by a magnetic force microscopy (MFM) and compared these measurements to those obtained with the STM-SQUID probe microscope. The MFM measurement was influenced by the sample surface. However, this effect was not observed in the STM-SQUID measurement.
  • Keywords
    SQUID magnetometers; magnetic field measurement; magnetic force microscopy; scanning tunnelling microscopy; surface topography measurement; SQUID probe microscope; STM probe microscope; magnetic field distribution; magnetic field measurement; magnetic force microscopy; meander line; scanning tunneling microscope; spatial resolution; surface topography measurement; Magnetic force microscopy; Magnetic resonance imaging; Magnetic tunneling; Microscopy; Probes; SQUIDs; Superconducting magnets; Flux guide; SQUID microscope; high-$T_{rm c}$ rf-SQUID; magnetic force microscopy; scanning tunneling microscope;
  • fLanguage
    English
  • Journal_Title
    Applied Superconductivity, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1051-8223
  • Type

    jour

  • DOI
    10.1109/TASC.2010.2086033
  • Filename
    5618589