• DocumentCode
    1368201
  • Title

    Effect of the pulse repetition rate on the composition and ion charge-state distribution of pulsed vacuum arcs

  • Author

    Yushkov, George Y. ; Anders, Andre

  • Author_Institution
    Inst. of High-Current Electron., Acad. of Sci., Tomsk, Russia
  • Volume
    26
  • Issue
    2
  • fYear
    1998
  • fDate
    4/1/1998 12:00:00 AM
  • Firstpage
    220
  • Lastpage
    226
  • Abstract
    The plasma composition and ion charge-state distributions of pulsed vacuum arcs have been investigated for carbon, aluminum, silver, platinum, and tantalum cathodes using a time-of-flight (TOF) charge-to-mass spectrometer. With the exception of carbon, it was found that all results depend on the arc pulse repetition rate, a fact which, up to now, has not been reported in the literature. It is shown that adsorption of gas on the cathode between are pulses leads to contamination of the metal plasma and to a reduction of metal ion charge states. These usually undesired effects can be avoided by operating at high arc pulse repetition rates of order 10 Hz or more. The results can be interpreted in terms of cathode spot type 1 (on contaminated cathode surfaces) and type 2 (on clean surfaces) which are well known from their different brightness and erosion behaviour. The transition between these modes was found to be gradual
  • Keywords
    aluminium; carbon; cathodes; mass spectra; plasma diagnostics; platinum; silver; tantalum; time of flight spectra; vacuum arcs; Ag; Al; C; Pt; Ta; cathode spot type; cathodes; clean surfaces; contaminated cathode surfaces; erosion behaviour; high arc pulse repetition rates; ion charge-state distribution; ion charge-state distributions; metal ion charge states; plasma composition; pulse repetition rate; pulsed vacuum arcs; time-of-flight charge-to-mass spectrometer; undesired effects; Aluminum; Brightness; Cathodes; Plasmas; Platinum; Silver; Spectroscopy; Surface cleaning; Surface contamination; Vacuum arcs;
  • fLanguage
    English
  • Journal_Title
    Plasma Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0093-3813
  • Type

    jour

  • DOI
    10.1109/27.669634
  • Filename
    669634