• DocumentCode
    1368262
  • Title

    Pulsed injection locking dynamics of passively mode-locked external-cavity semiconductor laser systems for all-optical clock recovery

  • Author

    Mathason, B.K. ; Delfyett, P.J.

  • Author_Institution
    Centre for Res. & Educ., Central Florida Univ., Orlando, FL, USA
  • Volume
    18
  • Issue
    8
  • fYear
    2000
  • Firstpage
    1111
  • Lastpage
    1120
  • Abstract
    The performance characteristics of a pulse injection locked, passively mode-locked (PML) external-cavity semiconductor laser system for all-optical clock recovery are investigated in detail. It is important to characterize the clock recovery dynamics to understand the fundamental capabilities and limitations of the clock recovery system. It is experimentally shown that these devices offer robust clock recovery with low phase and amplitude noise, low injected data power requirements, large frequency locking bandwidth, large phase tracking bandwidth, short lockup time, long dephasing time and immunity to bit-pattern-effects. Harmonic clock generation and subharmonic clock generation are demonstrated for data-rate conversion applications.
  • Keywords
    laser cavity resonators; laser mode locking; optical transmitters; semiconductor optical amplifiers; synchronisation; all-optical clock recovery; bit-pattern-effects; clock recovery dynamics; data-rate conversion applications; harmonic clock generation; large frequency locking bandwidth; large phase tracking bandwidth; long dephasing time; low injected data power requirements; low phase; passively mode-locked external-cavity semiconductor laser system; passively mode-locked external-cavity semiconductor laser systems; pulsed injection locking dynamics; robust clock recovery; short lockup time; subharmonic clock generation; Bandwidth; Clocks; Injection-locked oscillators; Laser mode locking; Laser noise; Noise level; Noise robustness; Optical pulses; Phase noise; Semiconductor lasers;
  • fLanguage
    English
  • Journal_Title
    Lightwave Technology, Journal of
  • Publisher
    ieee
  • ISSN
    0733-8724
  • Type

    jour

  • DOI
    10.1109/50.857757
  • Filename
    857757