DocumentCode :
1368290
Title :
Art analysis probing beneath the image: Electrotechnology backs up museum conservators in analyzing, conserving, and restoring works of art and in unmasking forgeries
Author :
Freifeld, K.
Volume :
23
Issue :
6
fYear :
1986
fDate :
6/1/1986 12:00:00 AM
Firstpage :
66
Lastpage :
71
Abstract :
Instruments for high-precision analyses of pieces of art and the techniques used in the analyses are discussed. Energy-dispersive X-ray fluorescence spectrometers, high-pressure liquid chromatographs, combined gas chromatograph and mass spectrometers, and X-ray fluorescence spectrometers combined with scanning electron microscopes, which have been slowly working their way into the top institutions in the art world, are described. Work on the Mona Lisa is noted as an example of the value of computer image processing for analyzing and restoring priceless paintings.
Keywords :
X-ray fluorescence analysis; X-ray spectrometers; chemical analysis; chromatography; computerised picture processing; mass spectrometer applications; mass spectroscopic chemical analysis; scanning electron microscopes; Mona Lisa; X-ray fluorescence spectrometers; combined gas chromatograph; computer image processing; high-pressure liquid chromatographs; mass spectrometers; paintings; scanning electron microscopes; Art; Fluorescence; Image restoration; Painting; Paints; Radiography; X-ray imaging;
fLanguage :
English
Journal_Title :
Spectrum, IEEE
Publisher :
ieee
ISSN :
0018-9235
Type :
jour
DOI :
10.1109/MSPEC.1986.6370935
Filename :
6370935
Link To Document :
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