DocumentCode :
1368382
Title :
Estimation of elliptical basis function parameters by the EM algorithm with application to speaker verification
Author :
Mak, Man-Wai ; Kung, Sun-Yuan
Author_Institution :
Center for Multimedia Signal Process., Hong Kong Polytech. Univ., China
Volume :
11
Issue :
4
fYear :
2000
fDate :
7/1/2000 12:00:00 AM
Firstpage :
961
Lastpage :
969
Abstract :
This paper proposes to incorporate full covariance matrices into the radial basis function (RBF) networks and to use the expectation-maximization (EM) algorithm to estimate the basis function parameters. The resulting networks, referred to as elliptical basis function (EBF) networks, are evaluated through a series of text-independent speaker verification experiments involving 258 speakers from a phonetically balanced, continuous speech corpus (TIMIT). We propose a verification procedure using RBF and EBF networks as speaker models and show that the networks are readily applicable to verifying speakers using LP-derived cepstral coefficients as features. Experimental results show that small EBF networks with basis function parameters estimated by the EM algorithm outperform the large RBF networks trained in the conventional approach. The results also show that the equal error rate achieved by the EBF networks is about two-third of that achieved by the vector quantization-based speaker models
Keywords :
covariance matrices; feature extraction; learning (artificial intelligence); parameter estimation; radial basis function networks; speaker recognition; EM algorithm; continuous speech corpus; covariance matrices; elliptical basis function networks; expectation-maximization algorithm; feature extraction; parameter estimation; radial basis function neural networks; speaker verification; Cepstral analysis; Covariance matrix; Gaussian noise; Interpolation; Kernel; Parameter estimation; Radial basis function networks; Speech analysis; Training data; Working environment noise;
fLanguage :
English
Journal_Title :
Neural Networks, IEEE Transactions on
Publisher :
ieee
ISSN :
1045-9227
Type :
jour
DOI :
10.1109/72.857775
Filename :
857775
Link To Document :
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