DocumentCode :
1368639
Title :
Progress toward a metal-base transistor
Author :
Poate, J.M. ; Dynes, Robert C.
Author_Institution :
AT&T Bell Labs., Murray Hill, NJ, USA
Volume :
23
Issue :
2
fYear :
1986
Firstpage :
38
Lastpage :
42
Abstract :
Interest has been revived in the silicon metal-base transistor because of significant progress in growing thin, single-crystal metal films on silicon. The unique properties of silicides are described and the possibility of attaining ballistic transport in silicides is discussed. The use of the metal-base transistor as a physical probe is considered.
Keywords :
bipolar transistors; elemental semiconductors; silicon; Si metal base transistor; ballistic electron transport; physical probe; semiconductors; silicides; single-crystal metal films; Cobalt; Crystals; Films; Silicides; Silicon; Transistors;
fLanguage :
English
Journal_Title :
Spectrum, IEEE
Publisher :
ieee
ISSN :
0018-9235
Type :
jour
DOI :
10.1109/MSPEC.1986.6370998
Filename :
6370998
Link To Document :
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