• DocumentCode
    1368756
  • Title

    Fault diagnostics and fault tolerant control

  • Author

    Zhou, D.H. ; Frank, P.M.

  • Author_Institution
    Tsinghua Univ., Beijing, China
  • Volume
    34
  • Issue
    2
  • fYear
    1998
  • fDate
    4/1/1998 12:00:00 AM
  • Firstpage
    420
  • Lastpage
    427
  • Abstract
    A novel simultaneous fault detection and diagnostics (FDD) and fault tolerant control (FTC) strategy for nonlinear stochastic systems in closed loops based on a continuous stirred tank reactor (CSTR) is presented. The purpose of control is to track the reactant concentration setpoint. Instead of output feedback we propose here to use proportional-integral-derivative (PID) state feedback, which is shown essential to achieve FTC against sensor faults. A new concept of “equivalent bias” is proposed to model the sensor faults. Both the states and the equivalent bias are on-line estimated by a pseudo separate-bias estimation algorithm. The estimated equivalent bias is then evaluated via a modified Bayes´ classification based algorithm to detect and diagnose the sensor faults. Many kinds of sensor faults are tested by Monte Carlo simulations, which demonstrate that the proposed strategy has definite fault tolerant ability against sensor faults, moreover the sensor faults can be on-line detected, isolated, and estimated simultaneously
  • Keywords
    Bayes methods; Monte Carlo methods; closed loop systems; control system synthesis; fault diagnosis; nonlinear control systems; state feedback; stochastic systems; three-term control; Monte Carlo simulations; PID state feedback; closed loops; continuous stirred tank reactor; equivalent bias concept; fault diagnostics; fault model; fault tolerant control; modified Bayes classification based algorithm; nonlinear stochastic systems; pseudo separate-bias estimation algorithm; reactant concentration setpoint; sensor faults; simultaneous detection/control strategy; Continuous-stirred tank reactor; Control systems; Fault detection; Fault tolerance; Fault tolerant systems; Nonlinear control systems; Output feedback; State estimation; State feedback; Stochastic systems;
  • fLanguage
    English
  • Journal_Title
    Aerospace and Electronic Systems, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9251
  • Type

    jour

  • DOI
    10.1109/7.670324
  • Filename
    670324