DocumentCode :
1368788
Title :
Ray-Tracing Simulation Techniques for Understanding High-Resolution SAR Images
Author :
Auer, Stefan ; Hinz, Stefan ; Bamler, Richard
Author_Institution :
Remote Sensing Technol., Tech. Univ. Munchen, Munich, Germany
Volume :
48
Issue :
3
fYear :
2010
fDate :
3/1/2010 12:00:00 AM
Firstpage :
1445
Lastpage :
1456
Abstract :
In this paper, a simulation concept is presented for creating synthetic aperture radar (SAR) reflectivity maps based on ray tracing. Three-dimensional models of man-made objects are illuminated by a virtual SAR sensor whose signal is approximated by rays sent through the model space. To this end, open-source software tools are adapted and extended to derive output data in SAR geometry followed by creating the reflectivity map. Rays can be followed for multiple reflections within the object scene. Signals having different multiple reflection levels are stored in separate image layers. For evaluating the potentials and limits of the simulation approach, simulated reflectivity maps and distribution maps are compared with real TerraSAR-X images for various complex man-made objects like a skyscraper in Tokyo, the Wynn Hotel in Las Vegas, and the Eiffel Tower in Paris. The results show that the simulation can provide very valuable information to interpret complex SAR images or to predict the reflectivity of planned SAR image acquisitions.
Keywords :
geophysical image processing; ray tracing; remote sensing by radar; synthetic aperture radar; Eiffel Tower; SAR geometry; SAR image acquisitions; SAR reflectivity maps; TerraSAR-X images; Tokyo skyscraper; Wynn Hotel; high-resolution SAR images; man-made object 3D models; open-source software tools; ray-tracing simulation techniques; simulation concept; synthetic aperture radar; virtual SAR sensor; 3-D modeling; Persistence of Vision Ray (POV Ray); TerraSAR-X; radar scattering; ray tracing; synthetic aperture radar (SAR) simulation;
fLanguage :
English
Journal_Title :
Geoscience and Remote Sensing, IEEE Transactions on
Publisher :
ieee
ISSN :
0196-2892
Type :
jour
DOI :
10.1109/TGRS.2009.2029339
Filename :
5238514
Link To Document :
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