DocumentCode :
1369238
Title :
Dosimetry Comparisons Between Various Single Event Test Facilities
Author :
Petersen, E.L.
Author_Institution :
17289 Kettlebrook Landing Jeffersonton,
Volume :
57
Issue :
6
fYear :
2010
Firstpage :
3477
Lastpage :
3482
Abstract :
We compare the statistical errors in single event experiments at various facilities. It is possible to have systematic standard deviations in the data as large as 90%, and to have errors of 35% when the desired values are less than 10%. In general the systematic errors in dosimetry are much larger than the statistical errors in the data points. Observation of the dosimetry errors should be a major part of the data analysis. We examine several experiments that compared ionization induced errors by low energy ions and high energy ions at different facilities. They are consistent in showing that the results do not depend on ion or energy.
Keywords :
data analysis; dosimetry; statistical analysis; data analysis; dosimetry; single event test facility; statistical error; systematic standard deviation; Dosimetry; Particle beams; Random access memory; Semiconductor device measurement; Single event upset; Cross sections; single event data analysis; single event dosimetry; single event effect (SEE); single event testing; single event upset;
fLanguage :
English
Journal_Title :
Nuclear Science, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9499
Type :
jour
DOI :
10.1109/TNS.2010.2071401
Filename :
5620945
Link To Document :
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