• DocumentCode
    1369258
  • Title

    Computationally efficient spectrum-recovery methods which compensate for static and dynamic nonidealities in electrooptic masks used in Hadamard-transform spectrometry

  • Author

    Xiong, Jize ; Dyer, Ruth A. ; Dyer, Stephen A.

  • Author_Institution
    Texas Instrum. Inc., Plano, TX, USA
  • Volume
    45
  • Issue
    5
  • fYear
    1996
  • fDate
    10/1/1996 12:00:00 AM
  • Firstpage
    854
  • Lastpage
    859
  • Abstract
    A Hadamard-transform spectrometer having no moving parts can be implemented by placing a stationary electrooptic mask in the optical path of a dispersive monochromator. However, two kinds of nonidealities-static and dynamic-associated with the electrooptic mask can cause distortions in the recovered spectrum-estimates. Two system models and corresponding recovery schemes have been developed previously that incorporate the effects of both types of nonidealities. This paper focuses on representing the dynamic nonidealities of the mask by a right-cyclic matrix TD, obtaining TD in practice, and computing TD-1 by computationally efficient moans, thus completing the development of fast implementations of the two previously reported recovery schemes. These computationally efficient recovery schemes were applied to simulated and experimental data, with examples of results presented and discussed
  • Keywords
    Hadamard transforms; computational complexity; electro-optical devices; monochromators; spectral analysis; spectrometers; Hadamard-transform spectrometry; computationally efficient moans; computationally efficient spectrum-recovery; dispersive monochromator; distortions; dynamic nonidealities; electrooptic mask; electrooptic masks; optical path; recovered spectrum-estimates; recovery schemes; right-cyclic matrix; static and dynamic nonidealities; system models; Computational modeling; Dispersion; Gratings; Helium; Instruments; Optical distortion; Signal to noise ratio; Spectroscopy; Switches;
  • fLanguage
    English
  • Journal_Title
    Instrumentation and Measurement, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9456
  • Type

    jour

  • DOI
    10.1109/19.536701
  • Filename
    536701