DocumentCode :
1369321
Title :
HOPE: an efficient parallel fault simulator for synchronous sequential circuits
Author :
Lee, Hyung Ki ; Ha, Dong Sam
Author_Institution :
Bradley Dept. of Electr. Eng., Virginia Polytech. Inst. & State Univ., Blacksburg, VA, USA
Volume :
15
Issue :
9
fYear :
1996
fDate :
9/1/1996 12:00:00 AM
Firstpage :
1048
Lastpage :
1058
Abstract :
HOPE is an efficient parallel fault simulator for synchronous sequential circuits that employs the parallel version of the single fault propagation technique. HOPE is based on an earlier fault simulator railed PROOFS, which employs several heuristics to efficiently drop faults and to avoid simulation of many inactive faults. In this paper, we propose three new techniques that substantially speed up parallel fault simulation: (1) reduction of faults simulated in parallel through mapping nonstem faults to stem faults, (2) a new fault injection method called functional fault injection, and (3) a combination of a static fault ordering method and a dynamic fault ordering method. Based on our experiments, our fault simulator, HOPE, which incorporates the proposed techniques, is about 1.6 times faster than PROOFS for 16 benchmark circuits
Keywords :
circuit analysis computing; fault diagnosis; logic testing; sequential circuits; HOPE; dynamic fault ordering; functional fault injection; nonstem faults; parallel fault simulator; static fault ordering; stem faults; synchronous sequential circuit; Circuit faults; Circuit simulation; Circuit testing; Combinational circuits; Delay; Design automation; Electrical fault detection; Fault detection; Scholarships; Sequential circuits;
fLanguage :
English
Journal_Title :
Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
Publisher :
ieee
ISSN :
0278-0070
Type :
jour
DOI :
10.1109/43.536711
Filename :
536711
Link To Document :
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