• DocumentCode
    1369422
  • Title

    Accurate measurements over wide parameter ranges

  • Author

    Kind, D.

  • Author_Institution
    Physikalisch Tech. Bundesanstalt, Braunschweig, Germany
  • Volume
    3
  • Issue
    4
  • fYear
    1996
  • fDate
    8/1/1996 12:00:00 AM
  • Firstpage
    473
  • Lastpage
    481
  • Abstract
    The SI units of physical quantities can be accurately realized and reproduced. The application of macroscopic quantum effects is an option for a highly improved reproduction of units. However, the measurement uncertainty over wide scale ranges easily can become unacceptably high. Proving traceability which is a general demand in establishing quality management systems according to ISO 9000, may then become a very difficult task. This is of particular significance to industrial metrology and research where multiples and submultiples of the respective SI units occur. Typical examples of this in the characterization of electrical insulation are gigaohm, megavolt, micrometer, nanoampere or even picocoulomb. The evaluation and improvement of the measurement accuracy on scales are therefore topical research subjects in metrology
  • Keywords
    ISO standards; electric variables measurement; measurement standards; units (measurement); ISO 9000; SI units; electrical insulation; industrial research; macroscopic quantum effects; measurement accuracy; metrology; parameter ranges; quality management systems; scales; traceability; Bridge circuits; Capacitance; Capacitors; Circuit testing; Dielectrics and electrical insulation; Electric variables measurement; Measurement standards; Metrology; Quality management; Voltage;
  • fLanguage
    English
  • Journal_Title
    Dielectrics and Electrical Insulation, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1070-9878
  • Type

    jour

  • DOI
    10.1109/94.536725
  • Filename
    536725