• DocumentCode
    1369533
  • Title

    A rational formulation of thermal circuit models for electrothermal simulation. I. Finite element method [power electronic systems]

  • Author

    Hsu, Jia Tzer ; Vu-Quoc, Loc

  • Author_Institution
    Dept. of Aerosp. Eng., Mech. & Eng. Sci., Florida Univ., Gainesville, FL, USA
  • Volume
    43
  • Issue
    9
  • fYear
    1996
  • fDate
    9/1/1996 12:00:00 AM
  • Firstpage
    721
  • Lastpage
    732
  • Abstract
    As the size of the semiconductor devices is getting smaller with advanced technology, self-heating effects in power semiconductor devices are becoming important. An electrothermal simulation of complete power electronic systems that include Si chips, thermal packages, and heat sinks is essential for an accurate analysis of the behavior of these systems. This paper presents a rational approach to construct thermal circuit networks equivalent to a discretization of the heat equation by the finite element method. Elemental thermal circuit networks are developed, which correspond to the linear and cubic Hermite elements in the 1-D case, to the triangular and rectangular elements in the 2-D case, and to the tetrahedral and cube elements in the 3-D case. These thermal circuit networks are to be connected to the electrical networks of power electronic systems to provide complete electrothermal models that can be conveniently used in any circuit simulator package. Verification examples are presented to demonstrate the accuracy of the proposed formulation
  • Keywords
    circuit analysis computing; equivalent circuits; finite element analysis; packaging; power electronics; thermal analysis; FEM; Si; Si chips; circuit simulator package; cube elements; cubic Hermite elements; electrothermal simulation; equivalent networks; finite element method; heat equation discretization; heat sinks; power electronic systems; power semiconductor devices; rectangular elements; self-heating effects; tetrahedral elements; thermal circuit models; thermal packages; triangular elements; Analytical models; Circuit simulation; Electronic packaging thermal management; Electrothermal effects; Heat sinks; Power electronics; Power semiconductor devices; Power system modeling; Semiconductor device packaging; Semiconductor devices;
  • fLanguage
    English
  • Journal_Title
    Circuits and Systems I: Fundamental Theory and Applications, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1057-7122
  • Type

    jour

  • DOI
    10.1109/81.536742
  • Filename
    536742