DocumentCode :
1369533
Title :
A rational formulation of thermal circuit models for electrothermal simulation. I. Finite element method [power electronic systems]
Author :
Hsu, Jia Tzer ; Vu-Quoc, Loc
Author_Institution :
Dept. of Aerosp. Eng., Mech. & Eng. Sci., Florida Univ., Gainesville, FL, USA
Volume :
43
Issue :
9
fYear :
1996
fDate :
9/1/1996 12:00:00 AM
Firstpage :
721
Lastpage :
732
Abstract :
As the size of the semiconductor devices is getting smaller with advanced technology, self-heating effects in power semiconductor devices are becoming important. An electrothermal simulation of complete power electronic systems that include Si chips, thermal packages, and heat sinks is essential for an accurate analysis of the behavior of these systems. This paper presents a rational approach to construct thermal circuit networks equivalent to a discretization of the heat equation by the finite element method. Elemental thermal circuit networks are developed, which correspond to the linear and cubic Hermite elements in the 1-D case, to the triangular and rectangular elements in the 2-D case, and to the tetrahedral and cube elements in the 3-D case. These thermal circuit networks are to be connected to the electrical networks of power electronic systems to provide complete electrothermal models that can be conveniently used in any circuit simulator package. Verification examples are presented to demonstrate the accuracy of the proposed formulation
Keywords :
circuit analysis computing; equivalent circuits; finite element analysis; packaging; power electronics; thermal analysis; FEM; Si; Si chips; circuit simulator package; cube elements; cubic Hermite elements; electrothermal simulation; equivalent networks; finite element method; heat equation discretization; heat sinks; power electronic systems; power semiconductor devices; rectangular elements; self-heating effects; tetrahedral elements; thermal circuit models; thermal packages; triangular elements; Analytical models; Circuit simulation; Electronic packaging thermal management; Electrothermal effects; Heat sinks; Power electronics; Power semiconductor devices; Power system modeling; Semiconductor device packaging; Semiconductor devices;
fLanguage :
English
Journal_Title :
Circuits and Systems I: Fundamental Theory and Applications, IEEE Transactions on
Publisher :
ieee
ISSN :
1057-7122
Type :
jour
DOI :
10.1109/81.536742
Filename :
536742
Link To Document :
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