DocumentCode
1370102
Title
Alternative approach to the calibration of six-port reflectometers using four standards
Author
Yeo, S.P. ; Ang, A.I.
Author_Institution
Dept. of Electr. Eng., Nat. Univ. of Singapore, Kent Ridge, Singapore
Volume
135
Issue
5
fYear
1988
fDate
10/1/1988 12:00:00 AM
Firstpage
353
Lastpage
355
Abstract
Other researchers have proposed six-port reflectometer calibration procedures that require only four standards. The authors describe an alternative approach to the implementation of such a calibration routine. The standards required are a matched load, a short circuit and two offset terminations. Laboratory tests indicate that measurement accuracies of within +or-0.01 in magnitude and within +or-1 degrees in phase can be obtained.
Keywords
calibration; measurement standards; microwave reflectometry; X-band reflectometer; calibration; matched load; microwave reflectometer; offset terminations; short circuit; six-port reflectometers; standards;
fLanguage
English
Journal_Title
Microwaves, Antennas and Propagation, IEE Proceedings H
Publisher
iet
ISSN
0950-107X
Type
jour
Filename
6731
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