• DocumentCode
    1370102
  • Title

    Alternative approach to the calibration of six-port reflectometers using four standards

  • Author

    Yeo, S.P. ; Ang, A.I.

  • Author_Institution
    Dept. of Electr. Eng., Nat. Univ. of Singapore, Kent Ridge, Singapore
  • Volume
    135
  • Issue
    5
  • fYear
    1988
  • fDate
    10/1/1988 12:00:00 AM
  • Firstpage
    353
  • Lastpage
    355
  • Abstract
    Other researchers have proposed six-port reflectometer calibration procedures that require only four standards. The authors describe an alternative approach to the implementation of such a calibration routine. The standards required are a matched load, a short circuit and two offset terminations. Laboratory tests indicate that measurement accuracies of within +or-0.01 in magnitude and within +or-1 degrees in phase can be obtained.
  • Keywords
    calibration; measurement standards; microwave reflectometry; X-band reflectometer; calibration; matched load; microwave reflectometer; offset terminations; short circuit; six-port reflectometers; standards;
  • fLanguage
    English
  • Journal_Title
    Microwaves, Antennas and Propagation, IEE Proceedings H
  • Publisher
    iet
  • ISSN
    0950-107X
  • Type

    jour

  • Filename
    6731