DocumentCode
1371330
Title
Fault injection for formal testing of fault tolerance
Author
Avresky, Dimiter ; Arlat, Jean ; Laprie, Jean-Claude ; Crouzet, Yves
Author_Institution
Texas A&M Univ., College Station, TX, USA
Volume
45
Issue
3
fYear
1996
fDate
9/1/1996 12:00:00 AM
Firstpage
443
Lastpage
455
Abstract
This study addresses the use of fault injection for explicitly removing design/implementation faults in complex fault-tolerance algorithms and mechanisms (FTAM), viz, fault-tolerance deficiency faults. A formalism is introduced to represent the FTAM by a set of assertions. This formalism enables an execution tree to be generated, where each path from the root to a leaf of the tree is a well-defined formula. The set of well-defined formulas constitutes a useful framework that fully characterizes the test sequence. The input patterns of the test sequence (fault and activation domains) then are determined to fewer specific structural criteria over the execution tree (activation of proper sets of paths). This provides a framework for generating a functional deterministic test for programs that implement complex FTAM. This methodology has been used to extend a debugging tool aimed at testing fault tolerance protocols developed by BULL France. It has been applied successfully to the injection of faults in the inter-replica protocol that supports the application-level fault-tolerance features of the architecture of the ESPRIT-funded Delta-4 project. The results of these experiments are analyzed in detail. In particular, even though the target protocol had been independently verified formally, the application of the proposed testing strategy revealed two fault-tolerance deficiency faults
Keywords
fault diagnosis; fault tolerant computing; fault trees; program debugging; protocols; ESPRIT-funded Delta-4 project; complex fault-tolerance algorithms; complex fault-tolerance mechanisms; debugging tool; execution tree; fault injection; fault tolerance; fault-tolerance deficiency faults; formal testing; functional deterministic test; inter-replica protocol; test sequence; Algorithm design and analysis; Context modeling; Debugging; Delay; Fault tolerance; Fault tolerant systems; Feedback loop; Parameter estimation; Protocols; Testing;
fLanguage
English
Journal_Title
Reliability, IEEE Transactions on
Publisher
ieee
ISSN
0018-9529
Type
jour
DOI
10.1109/24.537015
Filename
537015
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