Title :
n-Value Analysis of Position-Dependent Property Variability in Long-Length Coated Conductors
Author :
Willis, Jeffrey O. ; Coulter, J. Yates ; Rupich, Martin W.
Author_Institution :
Los Alamos Nat. Lab., Los Alamos, NM, USA
fDate :
6/1/2011 12:00:00 AM
Abstract :
We measure the current voltage (I-V) characteristics of high temperature superconductor coated conductors (HTS CCs) as a function of magnetic field, magnetic field angle, temperature, and position along multi-meter length practical wires. The critical current (Ic) data are analyzed to determine conductor uniformity, for quality assurance, and for feedback to the manufacturing process when an off-normal process event has occurred. We report on an expansion of this analysis to include the behavior of the power law exponent (n) of the voltage-current relationship, V ~ In, as a function of magnetic field amplitude and angle, temperature, and position for long CCs. American Superconductor recently identified as of interest H ||ab plane Ic variations observed in wires fabricated by the MOD/RABiTS process. These variations were confirmed by LANL to exist in a 13 m length of wire. We also found correlations between Ic and n that are indicative of these position-dependent microstructural/pinning property variations. We describe the applicability of this new n-value analysis to improved understanding of practical conductor performance and performance variability.
Keywords :
conductors (electric); critical current density (superconductivity); high-temperature superconductors; American Superconductor; HTSC coated conductors; LANL; MOD/RABiTS process; conductor uniformity; critical current; current-voltage characteristics; high temperature superconductor; long-length coated conductors; magnetic field angle; n-value analysis; performance variability; pinning property variations; position-dependent property variability; practical conductor performance; superconducting wires; Conductors; Correlation; Critical current; Length measurement; Superconducting magnets; Temperature measurement; Wires; Anisotropy; critical currents; current-voltage characteristic; high temperature superconductors;
Journal_Title :
Applied Superconductivity, IEEE Transactions on
DOI :
10.1109/TASC.2010.2087372