• DocumentCode
    1371614
  • Title

    MOS and bipolar gated thyristor: a thyristor with IGBT switching characteristics

  • Author

    Palmer, P.R. ; Hinchley, D.A. ; Stark, B.H.

  • Author_Institution
    Dept. of Eng., Cambridge Univ., UK
  • Volume
    145
  • Issue
    2
  • fYear
    1998
  • fDate
    4/1/1998 12:00:00 AM
  • Firstpage
    105
  • Lastpage
    110
  • Abstract
    The IGBT has become the device of choice in many high-voltage-power electronic applications, by virtue of combining the ease of MOS gate control with an acceptable forward voltage drop. However, designers have retained an interest in MOS gated thyristor structures which have a turn-off capability. These offer low on-state losses as a result of their latching behaviour. Recently, there have been various proposals for dual-gate devices that have a thyristor on-state with IGBT-like switching. Many of these dual gated structures rely on advanced MOS technology with inherent manufacturing difficulties. The MOS and bipolar gated thyristor offers all the advantages of dual gated performance, while employing standard IGBT processing techniques. The paper describes the MBGT in detail, and presents experimental and simulation results for devices based on realistic commercial processes. It is shown that the MBGT represents a viable power semiconductor device technology, suitable for a diverse range of applications
  • Keywords
    MOS-controlled thyristors; current density; losses; thyristor applications; IGBT switching characteristics; MBGT; MOS gated thyristor; bipolar gated thyristor; dual-gate devices; forward voltage drop; high-voltage-power electronic applications; latching behaviour; on-state losses; power semiconductor device; thyristor on-state; turn-off capability;
  • fLanguage
    English
  • Journal_Title
    Circuits, Devices and Systems, IEE Proceedings -
  • Publisher
    iet
  • ISSN
    1350-2409
  • Type

    jour

  • DOI
    10.1049/ip-cds:19981669
  • Filename
    674078