DocumentCode
1371614
Title
MOS and bipolar gated thyristor: a thyristor with IGBT switching characteristics
Author
Palmer, P.R. ; Hinchley, D.A. ; Stark, B.H.
Author_Institution
Dept. of Eng., Cambridge Univ., UK
Volume
145
Issue
2
fYear
1998
fDate
4/1/1998 12:00:00 AM
Firstpage
105
Lastpage
110
Abstract
The IGBT has become the device of choice in many high-voltage-power electronic applications, by virtue of combining the ease of MOS gate control with an acceptable forward voltage drop. However, designers have retained an interest in MOS gated thyristor structures which have a turn-off capability. These offer low on-state losses as a result of their latching behaviour. Recently, there have been various proposals for dual-gate devices that have a thyristor on-state with IGBT-like switching. Many of these dual gated structures rely on advanced MOS technology with inherent manufacturing difficulties. The MOS and bipolar gated thyristor offers all the advantages of dual gated performance, while employing standard IGBT processing techniques. The paper describes the MBGT in detail, and presents experimental and simulation results for devices based on realistic commercial processes. It is shown that the MBGT represents a viable power semiconductor device technology, suitable for a diverse range of applications
Keywords
MOS-controlled thyristors; current density; losses; thyristor applications; IGBT switching characteristics; MBGT; MOS gated thyristor; bipolar gated thyristor; dual-gate devices; forward voltage drop; high-voltage-power electronic applications; latching behaviour; on-state losses; power semiconductor device; thyristor on-state; turn-off capability;
fLanguage
English
Journal_Title
Circuits, Devices and Systems, IEE Proceedings -
Publisher
iet
ISSN
1350-2409
Type
jour
DOI
10.1049/ip-cds:19981669
Filename
674078
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