Title : 
GA-based design of multiplierless 2-D state-space digital filters with low roundoff noise
         
        
            Author : 
Lee, Y.H. ; Kawamata, M. ; Higuchi, T.
         
        
            Author_Institution : 
Graduate Sch. of Inf. Scis., Tohoku Univ., Sendai, Japan
         
        
        
        
        
            fDate : 
4/1/1998 12:00:00 AM
         
        
        
        
            Abstract : 
A new design method for multiplierless two-dimensional (2-D) state-space digital filters (SSDFs) with very low roundoff noise is presented. To eliminate multipliers in the hardware implementation, multiplierless 2-D SSDFs are designed under the constraint that all coefficients are expressed as one or two powers-of-two terms. They are attractive for low-cost implementation and high-speed operation. In addition, they can also perform highly accurate 2 D digital filtering because of very low roundoff noise. A combinatorial optimisation method based on a genetic algorithm (GA) is given to determine the coefficients. A stability test routine is also embedded in the GA-based design procedure to ensure the stability of the resultant multiplierless SSDFs. The proposed method can design multiplierless 2-D SSDFs not only with small approximation error but also with almost minimum roundoff noise. In addition they require fewer computational volume than 2-D SSDFs designed in a continuous coefficient space. For 16-bit words, the designed multiplierless 2-D SSDFs can be implemented with 24%, of the computational volume of 2-D SSDFs with real multipliers. The effectiveness of the proposed methods is demonstrated by two design examples
         
        
            Keywords : 
circuit optimisation; circuit stability; genetic algorithms; roundoff errors; state-space methods; two-dimensional digital filters; GA-based design; approximation error; combinatorial optimisation method; computational volume; continuous coefficient space; genetic algorithm; multiplierless 2D state-space digital filters; powers-of-two terms; roundoff noise; stability test routine;
         
        
        
            Journal_Title : 
Circuits, Devices and Systems, IEE Proceedings -
         
        
        
        
        
            DOI : 
10.1049/ip-cds:19981845