DocumentCode
1371711
Title
Defects tail off with six-sigma manufacturing
Author
Fieler, P.E. ; Loverro, N.
Author_Institution
Motorola Inc., Austin, TX, USA
Volume
7
Issue
5
fYear
1991
Firstpage
18
Lastpage
20
Abstract
A description is given of the six-sigma technique, the goal of which is to aid in the design of products that will function as intended, despite variations of 6 sigma ( sigma is the standard deviation) in their physical/operating parameters. The six-sigma metric provides a statistically defined yardstick for quantifying a product´s level of quality, using process capability indices. The meaning of the indices and why they are useful are explained. The use of Shewhart statistical process control (SPC) charts is briefly discussed. The six steps in the six-sigma program are outlined.<>
Keywords
integrated circuit manufacture; quality control; semiconductor device manufacture; statistical process control; Shewhart SPC charts; process capability indices; product design; quality control; semiconductor manufacturing; six-sigma manufacturing; statistical process control; Humans; Manufacturing processes; Probability distribution; Process control; Product design; Production; Raw materials; Roads; Robustness; Tail;
fLanguage
English
Journal_Title
Circuits and Devices Magazine, IEEE
Publisher
ieee
ISSN
8755-3996
Type
jour
DOI
10.1109/101.86129
Filename
86129
Link To Document