Automatic Meter for Determination of Solid Semiconductors Conductivity

Author

Gellon, Héctor ; Murdocca, Martín ; Páez, Carlos F Sosa ; Petrino, Ricardo

Author_Institution

Lab. de Electron., Investig. y Ser-vicios (LEIS), U.N.S.L., San Luis, Argentina

Volume

8

Issue

5

fYear

2010

Firstpage

477

Lastpage

481

Abstract

Conditions and requirements for the measurement of oxide semiconductors conductivity as well as methods and equipments available, are presented in this paper. Reasons are given for the automatic meter designed in this work. Conductivity is determined based on the voltage-current method using a PC and a commercial data acquisition board. The instrument is described mentioning the relevant points considered in the design. The software for the operation of the system is described as well as measurements results obtained in the laboratory on components that emulate the real experiments.

Keywords

data acquisition; electrical conductivity; electrical conductivity measurement; meters; semiconductors; automatic meter; conductivity measurement; data acquisition; solid semiconductors conductivity; voltage-current method; Conductivity measurement; Instruments; Laboratories; Materials; Resistors; Semiconductor device measurement; Software; Conductivity measurement; Measurement; Semiconductor materials measurements Semiconductor materials;

fLanguage

English

Journal_Title

Latin America Transactions, IEEE (Revista IEEE America Latina)

Publisher

ieee

ISSN

1548-0992

Type

jour

DOI

10.1109/TLA.2010.5623497

Filename

5623497