DocumentCode :
1372160
Title :
Rate dependent constitutive relations based on Anand model for 92.5Pb5Sn2.5Ag solder
Author :
Wilde, Jüurgen ; Becker, Klaus ; Thoben, Markus ; Blum, Wolfgang ; Jupitz, Thomas ; Wang, Guozhong ; Cheng, Zhaonian N.
Author_Institution :
IMTEK, Freiburg Univ., Germany
Volume :
23
Issue :
3
fYear :
2000
fDate :
8/1/2000 12:00:00 AM
Firstpage :
408
Lastpage :
414
Abstract :
A rate dependent constitutive model, the Anand model, was applied to represent the inelastic deformation behavior for a Pb-rich solder 92.5Pb5Sn2.5Ag used in electronic packaging and surface mount technology. This rate dependent model is a unified viscoplastic constitutive model using an internal state variable, the deformation resistance, to describe the averaged isotropic resistance to macroscopic plastic flow. In order to obtain the acquired data for the fitting of the material parameters of this unified model for 92.5Pb5Sn2.5Ag solder, a series of experiments of constant strain rate test and constant load creep test were conducted under isothermal conditions at different temperatures ranged from -65°C to 250°C. A procedure for the determination of material parameters was proposed in this paper. Model simulations and verifications revealed that there are good agreements between model predictions and experimental data. Moreover, some discussions on using this rate dependent model in the finite element simulation of stress/strain responses of solder joints under thermal fatigue loading were presented
Keywords :
creep; finite element analysis; lead alloys; packaging; plastic flow; silver alloys; soldering; stress-strain relations; surface mount technology; tin alloys; viscoplasticity; -65 to 250 C; Anand model; Pb-Sn-Ag; Pb-Sn-Ag solder alloy; creep; deformation resistance; electronic packaging; finite element simulation; inelastic deformation; plastic flow; rate dependent constitutive relations; stress/strain response; surface mount technology; thermal fatigue; viscoplasticity; Capacitive sensors; Conducting materials; Creep; Deformable models; Electronics packaging; Materials testing; Plastics; Predictive models; Surface-mount technology; Thermal stresses;
fLanguage :
English
Journal_Title :
Advanced Packaging, IEEE Transactions on
Publisher :
ieee
ISSN :
1521-3323
Type :
jour
DOI :
10.1109/6040.861554
Filename :
861554
Link To Document :
بازگشت