• DocumentCode
    1372174
  • Title

    Impact properties of PBGA assemblies reflowed in nitrogen ambient and compressed air

  • Author

    Wu, Y.P. ; Chan, Yan C.

  • Author_Institution
    Dept. of Electron. Eng., City Univ. of Hong Kong, China
  • Volume
    23
  • Issue
    3
  • fYear
    2000
  • fDate
    8/1/2000 12:00:00 AM
  • Firstpage
    421
  • Lastpage
    425
  • Abstract
    In this paper, the solder joint brittleness of plastic ball grid array (PBGA) assemblies has been studied by means of impact testing. The results show that the maximum impact force and the impact energy for PBGA assemblies reflowed in nitrogen ambient is higher than for those reflowed in compressed air. Reduction of the oxygen content from 1000 ppm to 50 ppm, reduces the initiation energy of impact. The impact fractured surfaces occur between the printed circuit board (PCB) pads and solder joints, i.e., in the brittle intermetallics region. The pores and impurities are mainly distributed within a ring at perimeter of the interface, with greater density at the edges than at the center. Reflow in a nitrogen ambient reduces the defect density, with reduction in oxygen content further reducing the density. Impact cracks begin from the defects of the Cu/solder interface, and propagate along the intermetallics
  • Keywords
    ball grid arrays; brittleness; impact testing; plastic packaging; reflow soldering; Cu; compressed air; defect density; electronic package; impact testing; impurity distribution; nitrogen ambient; oxygen content; plastic ball grid array; pore distribution; printed circuit board; reflow soldering; solder joint brittleness; Assembly; Electronics packaging; Impurities; Intermetallic; Nitrogen; Plastics; Printed circuits; Soldering; Surface cracks; Testing;
  • fLanguage
    English
  • Journal_Title
    Advanced Packaging, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1521-3323
  • Type

    jour

  • DOI
    10.1109/6040.861556
  • Filename
    861556