DocumentCode :
1372203
Title :
Influence of the grain boundary phase on the mechanical strength at aluminum nitride substrate surfaces
Author :
Asai, Hironori ; Takahashi, Takashi
Author_Institution :
Display Mater. & Devices Lab., Toshiba Corp., Kawasaki, Japan
Volume :
23
Issue :
3
fYear :
2000
fDate :
8/1/2000 12:00:00 AM
Firstpage :
452
Lastpage :
460
Abstract :
The influence of grain boundary phases on the mechanical strength at aluminum nitride (AlN) substrate surfaces, after a wet chemical process, was studied using AlN substrates doped with 2 wt% CaO or 4 wt% Y2O3. Mechanical strength was measured by pin pull-off, pin bending tests and Vickers hardness measurements. Test specimens were obtained by the processes of lapping, polishing, thin-film metallizing, photoengraving, plating, and brazing. The test results showed that the mechanical strength at the surface of Y2 O3-AlN substrates was higher than at CaO-AlN surfaces, where it was under the adhesion strength between the metallization layer and the AlN substrate. The mechanical strength at the surface of the CaO-AlN substrate was lost during patterning and plating. This was accompanied by an important weight loss in HNO3 and K2 O·n(B2O3) aqueous solution, due to dissolution of the grain boundary phase. The reason for the difference in the mechanical surface strength of AlN substrates after patterning and plating is that the CaO-AlN grain boundary phase dissolves in the chemical solution in the process more easily than the Y2O3-AlN gram boundary phase. The Y2O 3-AlN substrate showed unchanged pin pull-off and bending strength even after thermal cycling (1000 cycles) and 1000 h of a pressure cooker test. Although the CaO-AlN grain boundary phase seemed to cover all the grains, thermal conductivity was only slightly affected, because the grain boundary film was very thin
Keywords :
aluminium compounds; ceramic packaging; grain boundaries; mechanical strength; substrates; thermal conductivity; AlN:CaO; AlN:Y2O3; Vickers hardness; adhesion strength; aluminum nitride substrate surface; bending strength; brazing; ceramic package; dissolution; grain boundary phase; lapping; mechanical strength; patterning; photoengraving; pin bending test; pin pull-off; plating; polishing; pressure cooker test; thermal conductivity; thermal cycling; thin film metallization; wet chemical processing; Aluminum nitride; Chemical processes; Grain boundaries; Lapping; Mechanical variables measurement; Metallization; Substrates; Testing; Thermal conductivity; Transistors;
fLanguage :
English
Journal_Title :
Advanced Packaging, IEEE Transactions on
Publisher :
ieee
ISSN :
1521-3323
Type :
jour
DOI :
10.1109/6040.861560
Filename :
861560
Link To Document :
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