• DocumentCode
    1372227
  • Title

    A fast 3D modeling approach to electrical parameters extraction of bonding wires for RF circuits

  • Author

    Qi, Xiaoning ; Yue, C. Patrick ; Arnborg, Torkel ; Soh, Hyongsok T. ; Sakai, Hiroyuki ; Yu, Zhiping ; Dutton, Robert W.

  • Author_Institution
    Center for Integrated Syst., Stanford Univ., CA, USA
  • Volume
    23
  • Issue
    3
  • fYear
    2000
  • fDate
    8/1/2000 12:00:00 AM
  • Firstpage
    480
  • Lastpage
    488
  • Abstract
    Bonding wires are extensively used in integrated circuit (IC) packaging and circuit design in RF applications. An approach to fast three-dimensional (3D) modeling of the geometry for bonding wires in RF circuits and packages is demonstrated. The geometry can readily be used to extract electrical parameters such as inductance and capacitance. An equivalent circuit is presented to model the frequency response of bonding wires. To verify simulation accuracy, test structures have been made and measured. Excellent agreement between simulated and measured data is achieved for frequencies up to 10 GHz. The model is well suited for the design and analysis of circuits for cellular phone communication (i.e., order 2 GHz) and future wireless communication (i.e., order 5 GHz)
  • Keywords
    MMIC; UHF integrated circuits; cellular radio; equivalent circuits; frequency response; integrated circuit modelling; integrated circuit packaging; lead bonding; parameter estimation; 2 to 10 GHz; 3D modeling; 3D modeling approach; IC packaging; bonding wires; cellular phone communication; circuit design; electrical parameters; electrical parameters extraction; equivalent circuit; frequency response; simulation accuracy; test structures; wireless communication; Application specific integrated circuits; Bonding; Circuit simulation; Circuit synthesis; Computational geometry; Integrated circuit packaging; Parameter extraction; Radio frequency; Radiofrequency integrated circuits; Wires;
  • fLanguage
    English
  • Journal_Title
    Advanced Packaging, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1521-3323
  • Type

    jour

  • DOI
    10.1109/6040.861564
  • Filename
    861564