Title :
Improved correlation measurements using voltage and transimpedance amplifiers in low-frequency noise characterization of bipolar transistors
Author :
Bruce, S ; Vandamme, L.K.J. ; Rydberg, A.
Author_Institution :
Signals & Syst., Uppsala Univ., Sweden
fDate :
9/1/2000 12:00:00 AM
Abstract :
A method is presented to improve accuracy in low-frequency noise characterization of bipolar transistors by using both a voltage amplifier and transimpedance amplifiers
Keywords :
amplifiers; bipolar transistors; correlation methods; electric noise measurement; semiconductor device measurement; semiconductor device noise; bipolar transistor; correlation measurement; low frequency noise; transimpedance amplifier; voltage amplifier; Bipolar transistors; Circuit noise; Current measurement; Electrical resistance measurement; Low-frequency noise; Low-noise amplifiers; Noise level; Noise measurement; Performance evaluation; Voltage measurement;
Journal_Title :
Electron Devices, IEEE Transactions on
