Evaluation of an Accelerated ELDRS Test Using Molecular Hydrogen

Author

Pease, Ronald L. ; Adell, Philippe C. ; Rax, Bernard ; McClure, Steven ; Barnaby, Hugh J. ; Kruckmeyer, Kirby ; Triggs, B.

Author_Institution

RLP Res., Los Lunas, NM, USA

Volume

57

Issue

6

fYear

2010

Firstpage

3419

Lastpage

3425

Abstract

An accelerated total ionizing dose (TID) hardness assurance test for enhanced low dose rate sensitive (ELDRS) bipolar linear circuits, using high dose rate tests on parts that have been exposed to molecular hydrogen, has been proposed and demonstrated on several ELDRS part types. In this study several radiation-hardened “ELDRS-free” part types have been tested using this same approach to see if the test is overly conservative.

Keywords

bipolar integrated circuits; dosimetry; integrated circuit testing; life testing; radiation hardening (electronics); accelerated ELDRS Test; accelerated total ionizing dose; enhanced low dose rate sensitive bipolar linear circuits; hardness assurance test; high dose rate tests; molecular hydrogen; radiation hardening; Bipolar transistors; Degradation; Life estimation; Linear circuits; Radiation effects; Sensitivity; Bipolar linear circuits; discrete bipolar transistors; dose rate; enhanced low-dose-rate sensitivity (ELDRS); hydrogen; radiation effects; total ionizing dose;

fLanguage

English

Journal_Title

Nuclear Science, IEEE Transactions on

Publisher

ieee

ISSN

0018-9499

Type

jour

DOI

10.1109/TNS.2010.2070806

Filename

5624628