Title :
Evaluation of an Accelerated ELDRS Test Using Molecular Hydrogen
Author :
Pease, Ronald L. ; Adell, Philippe C. ; Rax, Bernard ; McClure, Steven ; Barnaby, Hugh J. ; Kruckmeyer, Kirby ; Triggs, B.
Author_Institution :
RLP Res., Los Lunas, NM, USA
Abstract :
An accelerated total ionizing dose (TID) hardness assurance test for enhanced low dose rate sensitive (ELDRS) bipolar linear circuits, using high dose rate tests on parts that have been exposed to molecular hydrogen, has been proposed and demonstrated on several ELDRS part types. In this study several radiation-hardened “ELDRS-free” part types have been tested using this same approach to see if the test is overly conservative.
Keywords :
bipolar integrated circuits; dosimetry; integrated circuit testing; life testing; radiation hardening (electronics); accelerated ELDRS Test; accelerated total ionizing dose; enhanced low dose rate sensitive bipolar linear circuits; hardness assurance test; high dose rate tests; molecular hydrogen; radiation hardening; Bipolar transistors; Degradation; Life estimation; Linear circuits; Radiation effects; Sensitivity; Bipolar linear circuits; discrete bipolar transistors; dose rate; enhanced low-dose-rate sensitivity (ELDRS); hydrogen; radiation effects; total ionizing dose;
Journal_Title :
Nuclear Science, IEEE Transactions on
DOI :
10.1109/TNS.2010.2070806
