Title :
Investigation and Mitigation of Analog SET on a Bandgap Reference in Triple-Well CMOS Using Pulsed Laser Techniques
Author :
Zanchi, Alfio ; Buchner, Stephen ; Hafer, Craig ; Hisano, Shinichi ; Kerwin, David B.
Author_Institution :
Aeroflex Colorado Springs, Colorado Springs, CO, USA
Abstract :
The devices responsible for a 600-μs Analog Single-Event Transient (ASET) observed in an NPN Brokaw-cell type bandgap reference during heavy-ion irradiation are identified using pulsed laser techniques with two completely different experimental setups. The capability of focusing the beam to specific junctions provided by the lasers led to recognize a novel Long Duration Pulse (LDP) upset mechanism which, contrary to the conventional wisdom in the field, is promoted by heavy capacitive filtering applied to the circuit´s output. A thorough comprehension of the cause of the LDP allowed for the proposal of design measures of mitigation that were implemented in silicon. Final tests performed with the same laser setup confirmed the successful resolution of such analog SET problem in this popular class of circuits.
Keywords :
CMOS analogue integrated circuits; elemental semiconductors; energy gap; ion beam effects; laser beam effects; silicon; NPN Brokaw-cell type bandgap reference; Si; analog single-event transient mitigation; analog single-event transient problem; circuit output; heavy capacitive filtering; heavy-ion irradiation; laser setup; long duration pulse upset mechanism; pulsed laser techniques; time 600 mus; triple-well CMOS; Photonic band gap; Radiation effects; SPICE; Single event transient; Transient analysis; Analog single event transient (ASET); bandgap reference; long duration pulse (LDP); pulsed laser; radiation effects; radiation mitigation; single-photon absorption;
Journal_Title :
Nuclear Science, IEEE Transactions on
DOI :
10.1109/TNS.2011.2172460
