DocumentCode :
1373105
Title :
Bayesian graph edit distance
Author :
Myers, Richard ; Wison, R.C. ; Hancock, Edwin R.
Author_Institution :
Praxis Critical Syst. Ltd., Bath, UK
Volume :
22
Issue :
6
fYear :
2000
fDate :
6/1/2000 12:00:00 AM
Firstpage :
628
Lastpage :
635
Abstract :
This paper describes a novel framework for comparing and matching corrupted relational graphs. The paper develops the idea of edit-distance originally introduced for graph-matching by Sanfeliu and Fu (1983). We show how the Levenshtein distance (1966) can be used to model the probability distribution for structural errors in the graph-matching problem. This probability distribution is used to locate matches using MAP label updates. We compare the resulting graph-matching algorithm with that recently reported by Wilson and Hancock. The use of edit-distance offers an elegant alternative to the exhaustive compilation of label dictionaries. Moreover, the method is polynomial rather than exponential in its worst-case complexity. We support our approach with an experimental study on synthetic data and illustrate its effectiveness on an uncalibrated stereo correspondence problem. This demonstrates experimentally that the gain in efficiency is not at the expense of quality of match
Keywords :
Bayes methods; computational complexity; computer vision; graph theory; Bayesian graph edit distance; Levenshtein distance; MAP label updates; corrupted relational graph comparison; corrupted relational graph matching; graph-matching algorithm; label dictionaries; polynomial complexity; probability distribution; structural errors; uncalibrated stereo correspondence problem; Bayesian methods; Dictionaries; Hamming distance; Layout; Machine vision; Object recognition; Pattern recognition; Polynomials; Probability distribution; Sensor fusion;
fLanguage :
English
Journal_Title :
Pattern Analysis and Machine Intelligence, IEEE Transactions on
Publisher :
ieee
ISSN :
0162-8828
Type :
jour
DOI :
10.1109/34.862201
Filename :
862201
Link To Document :
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