Title :
Guest editors´ introduction
Author :
Lombardi, Floriana ; Sami, Mariagiovanna
Author_Institution :
Northeastern University
fDate :
6/1/2000 12:00:00 AM
Keywords :
Costs; Degradation; Digital systems; Explosives; Fault tolerance; Manufacturing; Routing; Switches; Very large scale integration; Wiring;
Journal_Title :
Computers, IEEE Transactions on
DOI :
10.1109/TC.2000.862212
