Analyzing the Effects of TID in an Embedded System Running in a Flash-Based FPGA

Author

Tarrillo, Jimmy ; Azambuja, José Rodrigo ; Kastensmidt, Fernanda Lima ; Fonseca, Evaldo Carlos Pereira ; Galhardo, Rafael ; Goncalez, Odair

Author_Institution

Inst. de Inf., Univ. Fed. do Rio Grande do Sul (UFRGS), Porto Alegre, Brazil

Volume

58

Issue

6

fYear

2011

Firstpage

2855

Lastpage

2862

Abstract

This work analyzes the behavior of a designed embedded system composed of microprocessor, memories and SpaceWire (SpW) links under Total Ionizing Dose (TID) synthesized into a commercial flash-based FPGA from Actel. Two tests were performed: one the FPGA is configured just once at the beginning of the irradiation and the other the FPGA is reconfigured every 5 krad (Si). Results evaluate power supply current (Icc), temperature, function operation and performance degradation.

Keywords

embedded systems; field programmable gate arrays; flash memories; microprocessor chips; power supply circuits; Actel; SpaceWire links; designed embedded system; flash-based FPGA; function operation; memories; microprocessor; performance degradation; power supply current; temperature operation; total ionizing dose; Embedded systems; Field programmable gate arrays; Microprocessors; Phase locked loops; Radiation effects; SRAM chips; System-on-a-chip; Embedded system; Flash-based FPGA; radiation effects; system on chip; total ionizing dose;

fLanguage

English

Journal_Title

Nuclear Science, IEEE Transactions on

Publisher

ieee

ISSN

0018-9499

Type

jour

DOI

10.1109/TNS.2011.2170855

Filename

6075302