• DocumentCode
    1373458
  • Title

    System-Level Leakage Variability Mitigation for MPSoC Platforms Using Body-Bias Islands

  • Author

    Garg, Siddharth ; Marculescu, Diana

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Univ. of Waterloo, Waterloo, ON, Canada
  • Volume
    20
  • Issue
    12
  • fYear
    2012
  • Firstpage
    2289
  • Lastpage
    2301
  • Abstract
    Adaptive body biasing (ABB) is a popularly used technique to mitigate the increasing impact of manufacturing process variations on leakage power dissipation. The efficacy of the ABB technique can be improved by partitioning a design into a number of “body-bias islands,” each with its individual body-bias voltage. In this paper, we propose a system-level leakage variability mitigation technique to partition a multiprocessor system into body-bias islands at the processing element (PE) granularity at design time, and to optimally assign body-bias voltages to each island post-fabrication. As opposed to prior gate- and circuit-level partitioning techniques that constrain the global clock frequency of the system, we allow each island to run at a different speed and constrain only the relevant system performance metrics - in our case the execution deadlines. Experimental results show the efficacy of the proposed methodology; we demonstrate up to 40% and 60% reduction in the mean and standard deviation of leakage power dissipation respectively, compared to a baseline system without ABB. Furthermore, the proposed design-time partitioning is, on average, 38× faster than a previously proposed Monte Carlo-based technique, while providing similar reductions in leakage power dissipation.
  • Keywords
    multiprocessing systems; performance evaluation; power aware computing; system-on-chip; ABB technique; MPSoC platform; adaptive body biasing; body-bias islands; body-bias voltage; design time partitioning; leakage power dissipation reduction; manufacturing process variations; multiple processor system-on-chip; multiprocessor system; processing element granularity; system performance metrics; system-level leakage variability mitigation; Leakage current; Power dissipation; Threshold voltage; Adaptive body-bias (ABB); leakage power dissipation; power management; process variations;
  • fLanguage
    English
  • Journal_Title
    Very Large Scale Integration (VLSI) Systems, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1063-8210
  • Type

    jour

  • DOI
    10.1109/TVLSI.2011.2171512
  • Filename
    6075310