Title :
System-Level Leakage Variability Mitigation for MPSoC Platforms Using Body-Bias Islands
Author :
Garg, Siddharth ; Marculescu, Diana
Author_Institution :
Dept. of Electr. & Comput. Eng., Univ. of Waterloo, Waterloo, ON, Canada
Abstract :
Adaptive body biasing (ABB) is a popularly used technique to mitigate the increasing impact of manufacturing process variations on leakage power dissipation. The efficacy of the ABB technique can be improved by partitioning a design into a number of “body-bias islands,” each with its individual body-bias voltage. In this paper, we propose a system-level leakage variability mitigation technique to partition a multiprocessor system into body-bias islands at the processing element (PE) granularity at design time, and to optimally assign body-bias voltages to each island post-fabrication. As opposed to prior gate- and circuit-level partitioning techniques that constrain the global clock frequency of the system, we allow each island to run at a different speed and constrain only the relevant system performance metrics - in our case the execution deadlines. Experimental results show the efficacy of the proposed methodology; we demonstrate up to 40% and 60% reduction in the mean and standard deviation of leakage power dissipation respectively, compared to a baseline system without ABB. Furthermore, the proposed design-time partitioning is, on average, 38× faster than a previously proposed Monte Carlo-based technique, while providing similar reductions in leakage power dissipation.
Keywords :
multiprocessing systems; performance evaluation; power aware computing; system-on-chip; ABB technique; MPSoC platform; adaptive body biasing; body-bias islands; body-bias voltage; design time partitioning; leakage power dissipation reduction; manufacturing process variations; multiple processor system-on-chip; multiprocessor system; processing element granularity; system performance metrics; system-level leakage variability mitigation; Leakage current; Power dissipation; Threshold voltage; Adaptive body-bias (ABB); leakage power dissipation; power management; process variations;
Journal_Title :
Very Large Scale Integration (VLSI) Systems, IEEE Transactions on
DOI :
10.1109/TVLSI.2011.2171512