Title :
A Dynamic Voltage Restorer Equipped With a High-Frequency Isolated DC–DC Converter
Author :
Jimichi, Takushi ; Fujita, Hideaki ; Akagi, Hirofumi
Author_Institution :
Tokyo Inst. of Technol., Tokyo, Japan
Abstract :
This paper presents a dynamic voltage restorer (DVR) that is characterized by the use of a high-frequency unidirectional isolated dc-dc converter. A traditional DVR has a large and bulky series transformer even for three-phase low-voltage up to 480-V applications because the transformer operates at the line frequency (50 or 60 Hz). The emergence of state-of-the-art semiconductor devices and magnetic cores has driven power electronic engineers to develop compact high-frequency isolated dc-dc converters. This paper discusses the control and performance of a low-voltage DVR using a high-frequency isolated dc-dc converter. The high-frequency (20-kHz) transformer in the dc-dc converter is much smaller, for example, one-hundredth, in volume than the line-frequency transformer. Moreover, connecting the shunt converter to the load side brings a significant reduction in energy-storage capacity to the DVR. Experimental results obtained from a three-phase three-wire 200-V 5-kW laboratory system confirm the viability and effectiveness of the system configuration.
Keywords :
DC-DC power convertors; energy storage; magnetic cores; power supply quality; power transformers; semiconductor devices; dynamic voltage restorer; energy storage capacity; high-frequency DC-DC converter; high-frequency transformer; isolated DC-DC converter; line-frequency transformer; magnetic cores; power 5 kW; power electronic engineers; semiconductor devices; series transformer; shunt converter; unidirectional dc-dc converter; voltage 200 V; Circuit faults; Converters; Insulated gate bipolar transistors; MOSFETs; Magnetic cores; Power quality; Voltage fluctuations; Dynamic voltage restorers (DVRs); highfrequency transformers; isolated dc–dc converters; magnetic-flux bias; series transformers; voltage sags;
Journal_Title :
Industry Applications, IEEE Transactions on
DOI :
10.1109/TIA.2010.2091374