• DocumentCode
    1373811
  • Title

    A patterned and passivated organic-inorganic semiconductor heterojunction diode

  • Author

    Prabhakar, V. ; Forrest, S.R. ; Lorenzo, J.P. ; Vaccaro, K.

  • Author_Institution
    Dept. of Electr. Eng. & Mater. Sci., Univ. of Southern California, Los Angeles, CA, USA
  • Volume
    2
  • Issue
    10
  • fYear
    1990
  • Firstpage
    724
  • Lastpage
    726
  • Abstract
    A new process for photolithographically patterning and passivating organic-inorganic semiconductor heterojunction devices is described. It makes it possible to overcome two important barriers to the use of organic semiconductors in active optoelectronic integrated circuit applications. The organic semiconductor used was 2,4,9,10-peryelenetetracarboxylic dianhydride (PTCDA), which was vacuum deposited onto the surface of a p-Si substrate. Passivation was achieved via the deposition of SiO/sub 2/ onto the organic thin film using a low-temperature process. It was found that the organic-inorganic heterointerfaces is not damaged in the fabrication process, which uses several wet chemical etchants. In addition, all processes employed are compatible with both Si, III-V, and II-VI semiconductor device fabrication technologies. Preliminary reliability tests made at elevated temperatures indicate that the organic-inorganic heterojunction, after passivation is stable over extended periods of time.<>
  • Keywords
    organic semiconductors; photolithography; semiconductor diodes; semiconductor junctions; semiconductor technology; 2,4,9,10-peryelenetetracarboxylic dianhydride; II-VI semiconductor device fabrication; III-V semiconductor device fabrication; Si; Si semiconductor device fabrication; SiO/sub 2/; active optoelectronic integrated circuit; elevated temperatures; low-temperature process; organic semiconductors; organic thin film; organic-inorganic heterointerfaces; p-Si substrate; passivated organic-inorganic semiconductor heterojunction diode; passivation; photolithographically patterning; reliability tests; vacuum deposited; wet chemical etchants; Application specific integrated circuits; Chemical processes; Fabrication; Heterojunctions; Organic semiconductors; Passivation; Semiconductor thin films; Sputtering; Substrates; Thin film circuits;
  • fLanguage
    English
  • Journal_Title
    Photonics Technology Letters, IEEE
  • Publisher
    ieee
  • ISSN
    1041-1135
  • Type

    jour

  • DOI
    10.1109/68.60772
  • Filename
    60772