DocumentCode :
1373918
Title :
Mismatch Shaping Techniques to Linearize Charge Pump Errors in Fractional- N PLLs
Author :
Su, Pin-En ; Pamarti, Sudhakar
Author_Institution :
Dept. of Electr. Eng., Univ. of California, Los Angeles, CA, USA
Volume :
57
Issue :
6
fYear :
2010
fDate :
6/1/2010 12:00:00 AM
Firstpage :
1221
Lastpage :
1230
Abstract :
A recent charge pump linearization technique demonstrated 8 dB reduction in spurious tones caused by charge pump current mismatch in delta-sigma fractional-N phase locked loops. In this paper, two purely digital mismatch shaping techniques are proposed to modify and further improve the charge pump linearization technique. Both the techniques suppress spurious tones by randomizing the residual charge pump mismatch error power. The second technique further spectrally shapes the residual charge pump mismatch errors to suppress close-in phase noise. No spurs are observed and -120 dBc/Hz phase noise is achieved at frequency offsets lower than 10 kHz in simulation. A theoretical proof of the spectral shaping of the charge pump mismatch error power is also presented.
Keywords :
charge pump circuits; phase locked loops; charge pump linearization technique; fractional-N PLL; linearize charge pump errors; mismatch shaping techniques; Charge pump; fractional-$N$ phase-locked loop (PLL); fractional-$N$ spurs;
fLanguage :
English
Journal_Title :
Circuits and Systems I: Regular Papers, IEEE Transactions on
Publisher :
ieee
ISSN :
1549-8328
Type :
jour
DOI :
10.1109/TCSI.2009.2031746
Filename :
5371845
Link To Document :
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