DocumentCode :
1374065
Title :
Stability of Injection of a Subnanosecond High-Current Electron Beam and Dynamic Effects Within Its Rise Time
Author :
Yalandin, Michael I. ; Reutova, Anna G. ; Sharypov, Konstantin A. ; Shpak, Valery G. ; Shunailov, Sergey A. ; Ul´masculov, Marat R. ; Rostov, Vladislav V. ; Mesyats, Gennady A.
Author_Institution :
Inst. of Electrophys., Russian Acad. of Sci., Ekaterinburg, Russia
Volume :
38
Issue :
10
fYear :
2010
Firstpage :
2559
Lastpage :
2564
Abstract :
The stability of the injection of short electron beams and the dynamic processes that occur during their transport were experimentally studied. Beams of energy 200-300 keV, current of 1-1500 A, and duration of 0.05-3 ns with a current rise time of 30-300 ps were formed in a cold-cathode electrode gap. The distribution of the accelerating electric field was highly nonuniform. The cases of vacuum and air insulation of the electron diode were considered. The shortest beams with currents of a few amperes were generated in the mode of continuous acceleration of electrons in atmospheric air. For measuring beam currents, special collector probes were used which ensured a picosecond resolution.
Keywords :
air insulation; cathodes; electron probes; particle beam diagnostics; particle beam injection; particle beam stability; relativistic electron beams; vacuum insulation; accelerating electric field distribution; air insulation; atmospheric air; cold-cathode electrode gap; collector probes; current 1 A to 1500 A; dynamic processes; electron continuous acceleration; electron diode; electron volt energy 200 keV to 300 keV; subnanosecond high-current electron beam injection stability; time 0.05 ns to 3 ns; time 30 ps to 300 ps; vacuum insulation; Acceleration; Atmospheric measurements; Current measurement; Diodes; Electrodes; Electron beams; Insulation; Nonuniform electric fields; Particle beams; Stability; Current measurement; electron beams; electron emission; stability;
fLanguage :
English
Journal_Title :
Plasma Science, IEEE Transactions on
Publisher :
ieee
ISSN :
0093-3813
Type :
jour
DOI :
10.1109/TPS.2009.2034858
Filename :
5371868
Link To Document :
بازگشت