• DocumentCode
    1374095
  • Title

    Experimental 5-GHz RF Frontends for Ultra-Low-Voltage and Ultra-Low-Power Operations

  • Author

    Hsieh, Hsieh-Hung ; Chen, Huan-Sheng ; Hung, Ping-Hsi ; Lu, Liang-Hung

  • Author_Institution
    Dept. of Electr. Eng., Nat. Taiwan Univ., Taipei, Taiwan
  • Volume
    19
  • Issue
    4
  • fYear
    2011
  • fDate
    4/1/2011 12:00:00 AM
  • Firstpage
    705
  • Lastpage
    709
  • Abstract
    This paper presents experimental CMOS RF frontends suitable for ultra-low-power and ultra-low-voltage operations. In order to achieve the desirable gain and linearity of the receiver chain at a reduced supply voltage, the current-reused bias technique and the multiple-gated transistors are employed. As for the transmitter frontend, a low-voltage double-balanced mixer is utilized to maximize the conversion gain. In addition, a differential-to-single-ended circuit is also included to increase the saturated output power. Using a standard 0.18-μm CMOS process, the proposed circuits are realized for 5-GHz RF applications with a supply voltage of 0.6 V. The fabricated receiver frontend demonstrates a conversion gain of 14.5 dB and an IIP3 of -16 dBm with a power consumption of 2.1 mW, while the conversion gain and the output 1-dB compression of the transmitter frontend are 12.9 dB and -4.1 dBm, respectively, provided a dc power of 6 mW.
  • Keywords
    CMOS integrated circuits; MMIC mixers; field effect MMIC; low-power electronics; microwave transistors; CMOS RF front-ends; conversion gain; current-reused bias technique; differential-to-single-ended circuit; frequency 5 GHz; gain 12.9 dB; gain 14.5 dB; low-voltage double-balanced mixer; multiple-gated transistors; power 2.1 mW; power 6 mW; receiver frontend; size 0.18 mum; transmitter frontend; ultra-low-voltage operations; ultralow-power operations; voltage 0.6 V; CMOS RFIC; current-reused bias technique; low-power; low-voltage; moderate inversion; multiple-gated transistors; receiver frontend; transmitter frontend;
  • fLanguage
    English
  • Journal_Title
    Very Large Scale Integration (VLSI) Systems, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1063-8210
  • Type

    jour

  • DOI
    10.1109/TVLSI.2009.2037885
  • Filename
    5371873