• DocumentCode
    1374288
  • Title

    A fast signature computation algorithm for LFSR and MISR

  • Author

    Lin, Bin-Hong ; Shieh, Shao-Hui ; Wu, Cheng-Wen

  • Author_Institution
    Dept. of Electr. Eng., Nat. Tsing Hua Univ., Hsinchu, Taiwan
  • Volume
    19
  • Issue
    9
  • fYear
    2000
  • fDate
    9/1/2000 12:00:00 AM
  • Firstpage
    1031
  • Lastpage
    1040
  • Abstract
    A multiple-input signature register (MISR) computation algorithm for fast signature simulation is proposed. Based on the table look-up linear compaction algorithm and the modularity property of a single-input signature register (SISR), some new accelerating schemes-partial-input look-up tables and flying state look-up tables-are developed to boost the signature computation speed. Mathematical analysis and simulation results show that this algorithm has an order of magnitude speedup without extra memory requirement compared with the original linear compaction algorithm. Though this algorithm is derived for SISR, a simple conversion scheme exists that can convert internal-EXOR MISR to SISR. Consequently, fast MISR signature computation can be done
  • Keywords
    built-in self test; circuit analysis computing; computational complexity; fault simulation; integrated circuit testing; logic testing; shift registers; table lookup; BIST; LFSR; LUT methods; MISR computation algorithm; accelerating schemes; complexity analysis; conversion scheme; fast signature computation algorithm; fast signature simulation; flying state lookup tables; linear feedback shift registers; modularity property; multiple-input signature register; partial-input lookup tables; signature computation speed; single-input signature register; table lookup linear compaction algorithm; Analytical models; Built-in self-test; Circuit faults; Circuit simulation; Circuit testing; Compaction; Computational modeling; Electrical fault detection; Registers; Test pattern generators;
  • fLanguage
    English
  • Journal_Title
    Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0278-0070
  • Type

    jour

  • DOI
    10.1109/43.863643
  • Filename
    863643