DocumentCode :
1374568
Title :
A Bayesian Parametric Test for Multichannel Adaptive Signal Detection in Nonhomogeneous Environments
Author :
Wang, Pu ; Li, Hongbin ; Himed, Braham
Author_Institution :
Dept. of Electr. & Comput. Eng., Stevens Inst. of Technol., Hoboken, NJ, USA
Volume :
17
Issue :
4
fYear :
2010
fDate :
4/1/2010 12:00:00 AM
Firstpage :
351
Lastpage :
354
Abstract :
This paper considers the problem of knowledge-aided space-time adaptive processing (STAP) in nonhomogeneous environments, where the covariance matrices of the training and test signals are assumed random and different from each other. A Bayesian detector is proposed by incorporating some a priori knowledge of the disturbance covariance matrices, and exploring their inherent block-Toeplitz structure. Specifically, the block-Toeplitz structure of the covariance matrix allows us to model the training signals as a multichannel auto-regressive (AR) process. The resulting detector is referred to as the Bayesian parametric adaptive matched filter (B-PAMF) which, compared with nonparametric Bayesian detectors, entails a lower training requirement and alleviates the computational complexity. Numerical results show that the proposed B-PAMF detector outperforms the standard PAMF test in nonhomogeneous environments.
Keywords :
Bayes methods; Toeplitz matrices; adaptive filters; adaptive signal detection; autoregressive processes; computational complexity; covariance matrices; nonparametric statistics; statistical testing; B-PAMF detector; Bayesian parametric adaptive matched filter; Bayesian parametric test; block-Toeplitz structure; computational complexity; covariance matrices; knowledge-aided space-time adaptive processing; multichannel adaptive signal detection; multichannel autoregressive process; nonhomogeneous environments; nonparametric Bayesian detectors; training signals; Bayesian detection; nonhomogeneous environments; parametric adaptive matched filter; space-time adaptive signal processing;
fLanguage :
English
Journal_Title :
Signal Processing Letters, IEEE
Publisher :
ieee
ISSN :
1070-9908
Type :
jour
DOI :
10.1109/LSP.2009.2039380
Filename :
5371946
Link To Document :
بازگشت