DocumentCode :
1374597
Title :
Modeling the p-n junction i-u characteristic for an accurate calibration-free temperature measurement
Author :
Kanoun, Olfa
Author_Institution :
Univ. of the Federal Armed Forces Munich, Neubiberg, Germany
Volume :
49
Issue :
4
fYear :
2000
fDate :
8/1/2000 12:00:00 AM
Firstpage :
901
Lastpage :
904
Abstract :
The p-n junction i-u characteristic model is decisive for the accuracy enhancement of calibration-free temperature measurement. In this paper, we give a survey of adapted physically-based p-n junction i-u characteristic models, such as the Ebers-Moll2 the Ebers-Moll3 and the Gummel-Poon model. Furthermore, we build new models through polynomial extensions to the fundamental Shockey model. The considered models were investigated with regard to the application of calibration-free temperature measurement. Experimental results show a model improvement with both physically and mathematically-based models
Keywords :
curve fitting; measurement errors; p-n junctions; polynomial approximation; semiconductor device models; temperature measurement; Ebers-Moll models; Gummel-Poon model; accurate measurement; bipolar transistors; calibration-free temperature measurement; fundamental Shockey model; mathematically-based models; p-n junction i-u characteristic model; parameter extraction; physically-based models; polynomial extensions; resistance effects; systematic model errors; Calibration; Current measurement; Diodes; Electrical resistance measurement; Mathematical model; P-n junctions; Parameter extraction; Polynomials; Temperature measurement; Voltage;
fLanguage :
English
Journal_Title :
Instrumentation and Measurement, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9456
Type :
jour
DOI :
10.1109/19.863946
Filename :
863946
Link To Document :
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