Title :
Adapter correction in the measurement of two-port devices
Author :
DiBenditto, J.P. ; Fallica, Michael C. ; Uhlir, Arthur, Jr.
Author_Institution :
US Air Force, Hanscom AFB, MA, USA
fDate :
6/1/1988 12:00:00 AM
Abstract :
After an automatic network analyzer has been calibrated at its primary connectors, the full scattering matrices of adapters can be found with two known reflection standards in the secondary connector system. In coaxial systems, the standards can advantageously be a matched load and two `half standards´-a short for phase and an open circuit for magnitude. The method is applicable to noninsertable devices, waveguides, and novel transmission lines
Keywords :
coaxial cables; microwave reflectometry; network analysers; waveguides; adapter correction; automatic network analyzer; coaxial systems; matched load; measurement of two-port devices; microwave reflectometry; noninsertable devices; primary connectors; reflection standards; scattering matrices; secondary connector system; transmission lines; waveguides; Circuits; Frequency conversion; Frequency measurement; Laboratories; Low pass filters; Resistors; Temperature distribution; Thermal resistance; Thermistors; Voltage;
Journal_Title :
Instrumentation and Measurement, IEEE Transactions on
