Title :
Sheet and plated-metal measurements with a phase-ansle-type probe
Author :
Yates, W. A. ; Queen, J. L.
Author_Institution :
National Bureau of Standards, Washington, D. C.
fDate :
5/1/1954 12:00:00 AM
Abstract :
The basic operating principles and design data for an instrument to measure metal thickness or plating depth for nonferrous materials are described. The mode of operation, involving the measurement of a phase angle, permits the use of a noncontacting probe suitable for the continuous inspection of samples in motion.
Keywords :
Conductivity; Materials; Nickel; Probes; Silver; Steel;
Journal_Title :
American Institute of Electrical Engineers, Part I: Communication and Electronics, Transactions of the
DOI :
10.1109/TCE.1954.6372128
