Title :
A Long Reset-Time Power-On Reset Circuit With Brown-Out Detection Capability
Author :
Le, Huy-Binh ; Do, Xuan-Dien ; Lee, Sang-Gug ; Ryu, Seung-Tak
Author_Institution :
Dept. of Electr. Eng., Korea Adv. Inst. of Sci. & Technol., Daejeon, South Korea
Abstract :
A compact low-power on-chip power-on reset circuit with a brown-out detection capability is presented. With a pico-farad-order on-chip MOS capacitor, a long reset time is achieved. A prototype design implemented in a 0.18-μm CMOS process provides a reset signal with duration of hundreds of milliseconds. The embedded brown-out detection circuit can detect the event, as long as the brown-out duration is longer than the millisecond range. The chip consumes only 1 μA under a 1.8-V supply and occupies a 120 μm × 100 μm active area.
Keywords :
CMOS integrated circuits; MOS capacitors; low-power electronics; CMOS process; brown-out detection capability; compact low-power on-chip power-on reset circuit; current 1 muA; embedded brown-out detection circuit; long reset-time power-on reset circuit; pico-farad-order on-chip MOS capacitor; size 0.18 mum; voltage 1.8 V; Detectors; Power distribution; Power outages; Power supplies; Steady-state; System-on-a-chip; Brown-out detection; brown-out reset (BOR); power-on detection; power-on reset (POR);
Journal_Title :
Circuits and Systems II: Express Briefs, IEEE Transactions on
DOI :
10.1109/TCSII.2011.2168017
