Title :
Non-destructive testing of materials by microwave systems
Author :
Lasri, T. ; Glay, D. ; Mamouni, A. ; Leroy, Y.
Author_Institution :
Inst. d´´Electron. et de Microelectron. du Nord, CNRS, Villeneuve d´´Ascq, France
fDate :
3/5/1998 12:00:00 AM
Abstract :
The main objective of this study is to build systems which can, in some cases, be used as an alternative to the automatic network analyser (ANA), to improve the development of microwave characterisation of materials in an industrial context
Keywords :
microwave measurement; nondestructive testing; industrial material; microwave system; nondestructive testing;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:19980393
