• DocumentCode
    1375460
  • Title

    Ridged waveguide to microstrip transition for electromagnetic characterisation of materials in V-band

  • Author

    Hinojosa, J. ; Kruck, J.F. ; Dambrine, G.

  • Author_Institution
    Dept. de Electron., Univ. Politecnica de Cartagena, Spain
  • Volume
    36
  • Issue
    17
  • fYear
    2000
  • fDate
    8/17/2000 12:00:00 AM
  • Firstpage
    1468
  • Lastpage
    1470
  • Abstract
    A high-quality ridged waveguide to microstrip transition for determining the electromagnetic characteristics of thin-film materials in the V-band is presented. Complex permittivity and permeability are computed from S-parameter measurements of a microstrip cell propagating the dominant mode. Measurements in V-band of alumina show good agreement between measured and predicted values
  • Keywords
    S-parameters; alumina; dielectric thin films; magnetic permeability measurement; microstrip transitions; microwave measurement; permittivity measurement; ridge waveguides; Al2O3; S-parameter measurement; V-band; alumina; electromagnetic wave propagation; permeability; permittivity; ridge waveguide-to-microstrip transition; thin film material;
  • fLanguage
    English
  • Journal_Title
    Electronics Letters
  • Publisher
    iet
  • ISSN
    0013-5194
  • Type

    jour

  • DOI
    10.1049/el:20001067
  • Filename
    865042
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1375460