DocumentCode
1375481
Title
Quality Relevant Data-Driven Modeling and Monitoring of Multivariate Dynamic Processes: The Dynamic T-PLS Approach
Author
Li, Gang ; Liu, Baosheng ; Qin, S. Joe ; Zhou, Donghua
Author_Institution
Dept. of Autom., Tsinghua Univ., Beijing, China
Volume
22
Issue
12
fYear
2011
Firstpage
2262
Lastpage
2271
Abstract
In data-based monitoring field, the nonlinear iterative partial least squares procedure has been a useful tool for process data modeling, which is also the foundation of projection to latent structures (PLS) models. To describe the dynamic processes properly, a dynamic PLS algorithm is proposed in this paper for dynamic process modeling, which captures the dynamic correlation between the measurement block and quality data block. For the purpose of process monitoring, a dynamic total PLS (T-PLS) model is presented to decompose the measurement block into four subspaces. The new model is the dynamic extension of the T-PLS model, which is efficient for detecting quality-related abnormal situation. Several examples are given to show the effectiveness of dynamic T-PLS models and the corresponding fault detection methods.
Keywords
data models; least squares approximations; monitoring; data-based monitoring field; dynamic PLS algorithm; dynamic T-PLS approach; dynamic process modeling; dynamic total PLS model; fault detection method; latent structure model; measurement block; multivariate dynamic process monitoring; nonlinear iterative partial least squares procedure; process data modeling; quality data block; quality relevant data-driven modeling; quality-related abnormal situation; Algorithm design and analysis; Computational modeling; Data models; Fault detection; Least squares methods; Data-based monitoring; dynamic total projection to latent structures; multivariate dynamic processes; quality-related monitoring; Artificial Intelligence; Data Mining; Databases, Factual; Feedback; Models, Theoretical; Multivariate Analysis;
fLanguage
English
Journal_Title
Neural Networks, IEEE Transactions on
Publisher
ieee
ISSN
1045-9227
Type
jour
DOI
10.1109/TNN.2011.2165853
Filename
6080734
Link To Document