• DocumentCode
    1375618
  • Title

    Testable on-the-fly carry-save multiplier by alternating input data

  • Author

    Yu, Y.-C. ; Chang, T.-Y.

  • Author_Institution
    Electron. Res. & Service Org., Nat. Tsing Hua Univ., Hsinchu, Taiwan
  • Volume
    143
  • Issue
    5
  • fYear
    1996
  • fDate
    9/1/1996 12:00:00 AM
  • Firstpage
    345
  • Lastpage
    348
  • Abstract
    Montuschi and Ciminiera (1993) presented a carry-save multiplier without final addition. By utilising the don´t-care minterms in the original on-the-fly conversion logic and by modifying the summand circuits, the proposed carry-save multiplier can become a concurrent error detection (CED) scheme using a time redundancy technique, called the `alternating logic´ (AL) approach, under the cell fault model. The AL approach applies normal input data and alternated input data to the circuit under test (CUT) in two consecutive time steps, and both results should be bit-by-bit complemented to each other in the fault-free case; otherwise, the CUT is faulty. With a 1/(8n+14) delay in the normal computation [2/(8n+14) delay for the CED mode], where n is the operand length, the proposed scheme requires about an 18% area overhead and one extra pin
  • Keywords
    adders; carry logic; circuit testing; delays; design for testability; error detection; multiplying circuits; redundancy; alternating input data; alternating logic; area overhead; bit-by-bit complemented results; carry-save multiplier; cell fault model; circuit under test; computation delay; concurrent error detection scheme; consecutive time steps; don´t-care minterms; extra pin; fault-free case; on-the-fly conversion logic; operand length; summand circuits; testable circuit; time redundancy technique;
  • fLanguage
    English
  • Journal_Title
    Computers and Digital Techniques, IEE Proceedings -
  • Publisher
    iet
  • ISSN
    1350-2387
  • Type

    jour

  • DOI
    10.1049/ip-cdt:19960632
  • Filename
    537228