Title :
Measurement of complex permittivity and permeability of dielectric materials placed on a substrate
Author :
Kamarei, M. ; Daoud, N. ; Salazar, R. ; Bouthinon, M.
Author_Institution :
LEMO-INPG, CNRS VAR, Grenoble, France
Abstract :
A broad-band technique for making simultaneous frequency-swept measurements of complex permittivity and permeability of dielectric materials placed on a known substrate is described. The characteristics of these dielectric materials are evaluated from two-port scattering parameter measurements of a stripline cell, by using a microwave vector network analyser. Study of the sensitivity of the calculated permittivity and permeability as a function of the measurement errors is included.
Keywords :
magnetic permeability measurement; materials testing; measurement errors; microwave measurement; permittivity measurement; strip line components; broad-band technique; complex permeability measurement; complex permittivity; dielectric materials; frequency-swept measurements; known substrate; measurement; measurement errors; microwave permeability; microwave permittivity; microwave vector network analyser; sensitivity; stripline cell; two-port scattering parameter measurements;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:19910044
