Title :
Carbon Nanotube Interconnects: Process Variation via Polynomial Chaos
Author :
Stievano, Igor S. ; Manfredi, Paolo ; Canavero, Flavio G.
Author_Institution :
Dipt. di Elettron., Politec. di Torino, Torino, Italy
Abstract :
This paper addresses the generation of an enhanced stochastic model of a carbon nanotube interconnect including the effects of process variation. The proposed approach is based on the expansion of the constitutive relations of state-of-the-art deterministic models of nanointerconnects with uncertain parameters in terms of orthogonal polynomials. The method offers comparable accuracy and improved efficiency with respect to conventional methods like Monte Carlo in predicting the statistical behavior of the electrical performance of next-generation data links. An application example involving both the frequency- and time-domain analysis of a realistic nanointerconnect concludes this paper.
Keywords :
Monte Carlo methods; carbon nanotubes; frequency-domain analysis; polynomials; stochastic processes; time-domain analysis; Monte Carlo method; carbon nanotube interconnects; constitutive relation; electrical performance; frequency-domain analysis; nanointerconnects; orthogonal polynomial; polynomial chaos; process variation; statistical behavior; stochastic model; time-domain analysis; Integrated circuit interconnections; Integrated circuit modeling; Mathematical model; Nanotubes; Polynomials; Transmission line matrix methods; Carbon nanotubes (CNTs); circuit modeling; circuit simulation; electromagnetic compatibility (EMC); polynomial chaos (PC); stochastic analysis; tolerance analysis; transmission line; uncertainty;
Journal_Title :
Electromagnetic Compatibility, IEEE Transactions on
DOI :
10.1109/TEMC.2011.2171490